Modeling the dynamics of an AFM Atomic Force Microscopy cantilever
DOI:
https://doi.org/10.54495/Rev.Cientifica.v23i1.114Keywords:
Simulation, dynamics, cantilever, AFMAbstract
Currently some research involves computing, as well as experiment. On the other hand, computer simulation can provide valuable approaches to scientific problems. The atomic force microscopy (AFM) is one of the scanning probe microscopy techniques, which locally scans interatomic forces between a sample and a probe. The oscillatory motion of the cantilever can be simulated mathematically using a forced damped harmonic oscillator model. The fact that it is possible to mathematically approach the behaviour of the cantilever-sample system, allows them to be programmed and computed to predict the physical behavior at a theoretical level.
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